The Convergence of Advanced Models and Measurements for Virtual Prototyping Success

S-parameter files, while useful, ubiquitous, and very portable, only represent the way a specific device behaves in the test fixture environment and test conditions used for the characterization. S-parameters are not sufficient when designing with active devices where, in addition to being affected by the same substrate-and solder pad dependent parasitics, often require prediction of noise and complex non-linear behavior. Full-wave 3D Electromagnetic (EM) analysis has become a required step in some high frequency/high-speed design flows to account for coupling interactions between microwave components and between components and their surrounding environment. wave EM analyses that reduce design risk and re-work for compact and complex product form factors.