Accurate S-Parameter Measurements at Cryogenic Temperatures for Quantum Computing

The rapid advancement and commercialization of quantum computing is creating an urgent demand for RF quantum, semiconductor and electronics devices capable of operating at extreme cryogenic temperatures of 4K and below to shield quantum circuits from environmental noise and to operate semiconductor and electronics circuits with low noise and low power. However, the development of such device technologies is currently constrained by absence of accurate and reliable S-parameter measurements at cryogenic temperatures which hampers device validation, design optimization, and the reduction of hardware errors which are key factors for commercial scalability. State-of-the-art measurement methods developed to address this measurement bottleneck will be reviewed in this talk. This will include NPL’s approaches to addressing measurement accuracy of S-parameter measurements at cryogenic temperatures.