Dominant Error Contributors in S-Parameter Measurements at Cryogenic Temperatures

This talk presents an overview of the uncertainty sources affecting S-parameter measurements at cryogenic temperatures and the techniques to characterize them. We consider testbeds embedding coaxial switches for accurately characterizing connectorized components up to 40GHz. The talk seeks to provide valuable insight into the impact of dominant uncertainty sources on S-parameter measurement accuracy. Finally, details will be provided on the different approaches to quantifying dominant error contributors, allowing the combined measurement accuracy to be evaluated.