Challenges of On-Wafer Cryogenic Noise Parameter Measurements

Low-Noise Amplifiers (LNAs) are critical components in the readout circuits of quantum computing systems. The performance requirements — particularly the noise figure or noise temperature — are expected to approach the quantum limit, making characterization of LNAs, especially transistor-level measurements at the on-chip scale, extremely challenging. This talk presents these challenges, compares different methods for addressing them, and discusses future opportunities in this area.