Accurate On-Wafer Cryogenic Noise Measurement of LNAs Using an On-Chip SiGe BiCMOS Noise Source

Accurate noise measurement of cryogenic LNAs using standard techniques is a challenging task that requires careful calibration to reduce measurement uncertainty. In this talk, we will review existing techniques for cryogenic noise measurement before presenting a novel technique that leverages an on-chip cryogenic noise source. We will explain the benefits of this technique and show how we are able to achieve state-of-the-art noise measurement accuracy using this approach. The talk will conclude with a discussion of how the technique could be extended to cryogenic built-in-self-test applications.