A Built-in Self-Test System for 60GHz MIMO FMCW Radar SoCs

This work presents a built-in self-test (BIST) system designed for a 60GHz MIMO FMCW radar SoC. Compared to conventional mmWave RFIC/module level tests which require expensive test equipment and extensive time for test system calibration and settling, on-chip BIST system reduces both the cost and time, and provides additional characterization and monitoring capabilities. In this work, we introduce a comprehensive BIST system solution that includes the co-design of hardware, test procedures and algorithms, along with the detailed breakdown of key test and calibration items.