Computational Electromagnetics and Material Characterization: Some Meeting Points of the Two Worlds

Computational Electromagnetics and microwave material measurements have been traditionally advanced by separate research groups. Today, it is recognized that results of an EM computation can only be as good as materials’ data fed into it. This talks will indicate several points, where the two communities may and need to meet. First, it will illustrate the influence of individual material parameters on example designs of a 5G circuit and a mulitphysics microwave heating applicator. Then, it will provide case studies of the use of CEM tools for the design of novel instruments for precise characterization of materials at GHz-frequencies.