Generalized Thru-Reflect-Line Calibration for 1-220-GHz Single-Sweep Ultra-Wideband On-Wafer Measurement

This work exploits the Generalized Thru-Reflect-Line (GTRL) technique—originally introduced for multi-mode waveguides—to provide a compact and unified calibration approach for single-mode Ultra-Wideband planar structures. The method is experimentally validated on SiC Grounded Coplanar Waveguides (GCPWs) over a continuous single-sweep frequency range of 1‒220 GHz. Compared to standard TRL, the GTRL formulation offers a distinct advantage: while demonstrating exceptional robustness across this extreme bandwidth, it inherently extracts the complex propagation constant, providing the effective dielectric constant and transmission loss without additional post-processing.