Noise Parameter Characterization of Microwave Active Devices vs. Size

This talk will discuss and demonstrate a recent technique developed to characterize the noise parameters of microwave active devices by varying their size. The approach is very innovative as it provides an effective solution to remove the main bottleneck that makes the measurement of the noise parameters both tedious and burdensome: the requirement of an input tuner. When measuring the noise figure of a set of devices with different sizes, the input tuner is no longer required. The clear advantage of this solution is that noise parameters can be measured quickly over frequency, bias and temperature.