Cryogenic On-Wafer Noise Measurements Using a Cold-Attenuator Method

This presentation discusses cryogenic characterization techniques for the development of cryogenically cooled MMIC LNAs. On-chip testing at cryogenic temperatures speeds up chip developments and qualifications. A focus lies on cryogenic measurements on chip level in order to gather data for device model extraction and for cryogenic MMIC design. Moreover, the talk will discuss on-chip noise characterization including an uncertainty analysis for MMIC testing and model extraction. An overview of recent cryogenic model results and LNA MMIC designs, including state of the art results in different frequency bands, concludes the talk.