Millimeter-wave Device Characterization Under Wideband Modulated Signals using Vector Network Analyzer Frequency Extenders

This paper presents an innovative frequency-extender-based measurement system designed for the comprehensive characterization of mmWave devices under both CW and modulated signal excitation. In addition to traditional CW-based measurement systems consisting of VNAs and VNA frequency extenders, the proposed system integrates an IF-VSA and IF-VSAs. During modulated signal testing, the IF VSG feeds the VNA frequency-extender, enabling the generation of RF modulated signals at the DUT reference plane. Concurrently, the IF-VSAs are connected to the VNA frequency-extenders, facilitating the capture of modulated signals at the DUT input and output. Additionally, the system incorporates a novel ILC algorithm that linearizes the frequency multipliers (FMs) within VNA frequency-extenders ensuring error-free RF vector signal generation. The proposed system was validated experimentally at V-band (around 57.6GHz) using OML VNA frequency-extenders. The novel ILC algorithm was employed to linearize the FM within the OML, enabling the mixer-less generation of up to 800MHz, 256-QAM OFDM signals.