Development of W-Band Dual-Polarization Kinetic Inductance Detectors on Silicon

A polarimetric detector in the W-band based on Lumped-Element Kinetic Inductance Detectors (LEKIDs) is presented. Each single optical element consists of two Ti/Al LEKIDs placed in orthogonal configuration on both sides of a Silicon substrate. Room temperature quasi-optical characterization demonstrates the high frequency design and the absorption in the W-band. Cryogenic characterization confirms the high quality factor of the fabricated resonators and polarization sensitivity in the W-band. The design proposed in this work is suitable for the development of polarimetric cameras of large arrays of LEKIDs for future astronomical experiments.