Towards Confident Wafer-Level Characterization at mm-Wave Frequencies

The rapid demand for measurements at ever-higher frequencies is driving new requirements for accuracy, traceability, and integration in wafer-level test systems. With increasing circuit complexity and expanding applications in 5G, 6G, AI and beyond, engineers face growing challenges in achieving reliable results at mm-wave frequencies. This presentation will review the progress of state-of-the-art instrumentation, calibration, and measurement techniques, highlighting recent advances in uncertainty quantification and possible traceability chains for wafer-level environments. Practical examples will demonstrate how these demanding goals can be achieved with confidence in a typical engineering measurement laboratory, and how uncertainties can be systematically reduced.