Sources of Uncertainty in RF-Probe Based Measurements of Antennas On Chip

With the advent of the new 6G generation of wireless communication, higher frequency bands (>30GHz) are increasingly being used with antennas integrated on chip and in package. To characterize the antennas in terms of S11, gain and radiation patterns, they are connected to a measuring instrument using so-called RF probes. Measurements with these RF probes present challenges in the form of blockage, unwanted radiation, reproducibility in the placement of the probes and possible damage because of their fragility. In this workshop, we will address these challenges and introduce a possible explanation and solutions to improve measurement accuracy.