Optimizing On-Wafer RF Testing and Calibration in an Industrial Environment for Next-Generation Silicon Components

The rapid growth of mobile data traffic is driven by the proliferation of connected devices and new consumption modes like 4K streaming. Silicon technologies, with low cost and high performance, enable the design of low-power, high-gain electronic circuits. System design relies on precise electrical models of passive and active components, validated by high-frequency measurements up to 110GHz. Reliable RF measurements and large on-wafer test volumes are crucial to accelerate industrialization. R&D efforts focus on optimizing calibration methods and reducing measurement uncertainties up to 170GHz, addressing industrial constraints and supporting future high-frequency applications.