Modulated Signals Traceability Path

Emerging communication systems support increased data-rates through increased bandwidth, increased modulation order, and enhanced MIMO capability. Each of these advances relies on technological improvements in all areas of the communication system: amplifiers, antennas, modulation, and demodulation, guided by both component-level measurements and system-level metrics such as EVM and BER. NIST Communications Technology Laboratory supports a traceability path that extends from fundamental RF metrology to multi-faceted, system-level metrics, measured by modern instruments including the large-signal network analyzer. We present recent research in this area for microwave and mm-wave applications. Topics will include ultralow phase noise optical and RF signal referencing, SI-traceable on-wafer S parameters, power and phase, and new electro-optic techniques to simplify the traceability of modulated waveforms. We discuss how these fundamental RF metrics are extended to EVM and other metrics of interest to system designers.