Traceable Characterization of Electronic and Optoelectronic Pulse Generators Used as Broadband Phase References

The utilization of high-speed photodiodes or electrical pulse generators as phase references requires precise knowledge of their characteristic frequency response. The device characterization traceable to the International System of Units (SI) is the task of national metrology institutes worldwide. This talk will illustrate the time-domain technique Electro-Optical Sampling (EOS) as a well-established method for the characterization of high-frequency electronic and optoelectronic devices. The influence of, for example, mismatch, system components and measurement artefacts will be highlighted, resulting in a full waveform analysis including sample-by-sample uncertainty computation.