Microwave Avalanche Noise Diodes for in-situ Noise Measurements and Calibration: a Decade of Research

This contribution summarizes a decade of research on avalanche noise, from modeling and initial experiments to practical applications in microwave measurements, radio astronomy and cryptography. The talk focuses on Built-In Self-Test (BIST) circuits that exploit avalanche noise diodes, a class of devices that has been developed recently in commercial silicon technologies. Avalanche noise diodes can be used up to mm-waves as reference signal sources for testing circuits and systems. They have proven to be simple, robust and very stable and are often exploited as calibration standards in satellite missions.