MicroApps Seminars

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Russell Hoppenstein
Qorvo
Location
Microapps Theater, Booth 5423
Abstract

Next-generation communication and radar systems require wide bandwidth signals to support high data rates and enhanced resolution. Low phase noise systems are critical in high-QAM rate and OFDM signals to minimize bit error rate (BER) and to maintain signal integrity. Qorvo introduces a line of digital controlled reference oscillators providing excellent integrated jitter performance for high-end systems. The solution highlights a temperature-controlled reference oscillator (TCXO) for a PLL/VCO integrated into a microwave up/down converter. The presentation highlights the composite Error Vector Magnitude (EVM%) performance upconverting a 5GNR signal up to 26 GHz with various sub-carrier spacings.

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Aleksandr Kotiukov
KVG GmbH
Location
Microapps Theater, Booth 5423
Abstract

Precision Low Phase Noise Oven Controlled Crystal Oscillators with output frequencies from 10 to 100 MHz are the key reference sources for modern RF equipment. Phase noise, aging and frequency stability vs. temperature are the main parameters of OCXO to ensure the quality of equipment. But another important parameters like dynamic temperature sensitivity, vibration sensitivity (not only for moving vehicles) are being ignored mistakenly by the developers. What parameters may be important for? What are the phase noise limit for oscillators? What type of crystals we use and how they influence the oscillator’s parameters?

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Ajeet Pal
Texas Instruments India Pvt. Ltd.
Location
Microapps Theater, Booth 5423
Abstract

Frequency hopping between multiple LO frequencies find application in downconverter and upconverter chain where switching time expected is very low. Frequency Switching time in PLL based synthesizers containing integrated VCOs/Multipliers is dominated by VCO/Multiplier calibration time. During the calibration time, output frequency can vary a lot, which is undesired. Proposed FULL ASSIST solution in LMX26xx reduces calibration time to zero by forcing the settings related to frequency switch, all at one go using double buffering registers and thus avoids cycle slipping. With this feature in LMX26xx, overall lock time depends only on minimal register writes and analog loop settling.

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Fabricio Dourado
Rohde & Schwarz
Location
Microapps Theater, Booth 5423
Abstract

EVM and ACLR are fundamental to all terrestrial wireless communication systems. However, over-the-air testing - common in phased array applications and others - raises a key question: are test results limited by the test system or the antenna's performance? This challenge is particularly pronounced in systems with a high number of elements, such as SATCOM phased arrays. This MicroApps seminar provides a clear answer, presenting practical measurement-based solutions for direct and indirect far-field testing, illustrated with real-world examples using advanced vector signal analysis and generation equipment.

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Dean Banerjee
Texas Instruments
Location
Microapps Theater, Booth 5423
Abstract

Frequency hopping across wide frequency range find application in multiple systems used in electronic warfare, defense radio, and communications where switching time expected is very low. The Link-16 network used by NATO for transferring real-time tactical information requires frequency hopping under 13 µs. Frequency Switching time in PLL based synthesizers containing integrated VCOs is dominated by VCO calibration time which can go as high as 200 us depending on the capacitor bank in VCOs. Proposed instant calibration feature in LMX2820 reduces the VCO calibration time to 5 us across the wideband frequency range from 45 MHz to 22.6 GHz.

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Fabricio Dourado
Rohde & Schwarz
Location
Microapps Theater, Booth 5423
Abstract

Confident in the accuracy of your Gain to Noise Temperature (G/T) measurements for large phased arrays? Traditional calculation-based methods can be error-prone and cumbersome. Typically, accurate G/T values require combining datasheet analysis, testing, simulation, calibration, and validation. This MicroApps seminar introduces a measurement-based approach that eliminates calculations, ensuring reliable G/T measurements for complex phased arrays. Simplify your workflow, boost accuracy, and gain confidence in your results with this innovative method.

Wendy Shu
Eravant
Location
Microapps Theater, Booth 5423
Abstract

Millimeter wave (mmWave) technology holds unparalleled potential to revolutionize industries ranging from telecommunications to advanced sensing. Yet, its full promise remains constrained by barriers in cost, expertise, and accessibility. Historically, mmWave has been considered impossible to scale, but Eravant has developed practical solutions to overcome this challenge. In this keynote, Wendy Shu, CEO of Eravant, will explore how scaling organizations and lowering barriers are critical to achieving commercial viability and unlocking mmWave's vast applications. Drawing on Eravant's approach to democratizing mmWave across catalog (COTS), custom solutions, test & measurement, and services, Wendy will share innovative strategies for enabling broader participation by engineers, scientists, and employees alike. She will also call on industry leaders to think about building companies where people from diverse backgrounds and experience levels can contribute meaningfully, so we can fully realize the transformative potential of mmWave technology.

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Location
Microapps Theater, Booth 5423

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Fabricio Dourado
Rohde & Schwarz
Location
Microapps Theater, Booth 5423
Abstract

Characterizing phased arrays demands numerous radiation pattern measurements to ensure uniform, fast, and accurate beam steering with minimal scan loss and side-lobe levels. Additional tests for tapering, null steering, and dual-polarization control further increase the burden. Discover how to drastically reduce measurement time from minutes to seconds, enabling more comprehensive phased array testing. Our seminar demonstrates a game-changing approach to rapid radiation pattern measurement, transforming your testing workflow.

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Markus Loerner
Rohde & Schwarz
Location
Microapps Theater, Booth 5423
Abstract

Load pull is a common technique to understand the behavior of RF frontends with varying conditions and matchings in the target application, optimize the DUT or create accurate models. RF front ends often drive signals into antennas which are nominal 50 Ohm, but in reality far off. As PA performance changes with different impedances, the only way to ensure proper performance is to test with the target signals and varying impedances, thus wideband loadpull. A fast and cost-efficient solution will be discussed in this session.

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Navneet Kataria
Anritsu,ARFTG
Location
Microapps Theater, Booth 5423
Abstract

D band and G band are still the two most promising bands for 6G research area. The initial research was all related to single ended devices - amplifiers, filters, mixers etc. However, in the recent times the differential device testing and characterization of the devices has become important. The fundamental devices needs to be characterized from DC to highest frequency possible (KHz range to 200+GHz). A Vector Network analyzer with true differential stimulus and Differential probes is required for device characterization and testing. Measurements such a differential IMD, Gain, Gain compression, Noise figure are crucial measurements.

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GAVIN FISHER
FORMFACTOR GmbH
Location
Microapps Theater, Booth 5423
Abstract

Developments in coaxial connector design have now extended the available frequency range for systems relying on the TEM mode to beyond 200 GHz, historically the domain of waveguides. This makes it possible to compare measurements made using probes employing these connectors with the previous state of the art probes using waveguides. This talk will present these results and test methodologies and discuss benefits accruing from using a single-sweep system, besides the obvious reduction in test time and inventory cost from not having to maintain stock of several banded devices.

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Markus Loerner
Rohde & Schwarz
Location
Microapps Theater, Booth 5423
Abstract

New advances in Vector Network implementations allow faster sweep times with increased sensitivity to enable faster and more accurate S parameter measurements. This is of special interest in the world of growing number of supported frequency bands and thus more filter paths in modern mobile phones. Adding more filter paths means more expensive validation. Reducing the test time is a major strike back to cut test cost without sacrificing sensitivity and measurement uncertainty.

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Marzena Olszewska-Placha
QWED Sp. z o.o.
Location
Microapps Theater, Booth 5423
Abstract

Development in 5G/6G technologies require precise characterization of the complex permittivity of materials in the microwave and millimeter wave spectra, addressing various applications, e.g. microwave 5G bands, 77-GHz automotive radars, D- and G-band high-speed communication systems. Cavity and dielectric resonator devices supporting material characterization in 1-20GHz range will be presented at this seminar altogether with a family of Fabry-Perot open resonators enabling wideband measurements of solid dielectrics in the 15-220 GHz range. Measurement examples will feature PCB substrates, ultra-thin foils, automotive materials, in-plane anisotropic materials, with the measurement inaccuracy as low as 0.5% (2%) for the dielectric constant (loss tangent)

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Ken Mays
The Boeing Company
Location
Microapps Theater, Booth 5423
Abstract

The ability to understand the thermal impact on performance has become a necessity for today’s complex electronic designs. Having an integrated thermal analysis tool within a multiphysics system design flow proves to be very beneficial for determining overall performance and becomes necessary to maintain design flow synchronization. This paper demonstrates the capabilities of the Cadence Celsius Thermal Solver, an electrothermal co-simulation solution that provides analysis and design insights to detect and mitigate thermal issues early in the design cycle. Simulations are validated with measurements on devices designed for thermal imaging and current density performance.

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Baljit Chandhoke
Microchip Technology
Location
Microapps Theater, Booth 5423
Abstract

This session explores performance advances in GaN MMIC power amplifiers applied to advanced radar technology, linear power Satcom uplinks, 5G and wideband power amplifier applications. It discusses GaN on SiC MMIC power attributes that are critical to improving and offering more compelling next-generation products for 5G, Aerospace & Defense and SatCom applications. Different types of beamforming architectures along with tradeoffs will be covered. For Space applications, RF Solutions from COTS to Rad Hard, plastic to hermetically sealed packages will be discussed.

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Hiroshi Sato
Nisshinbo Micro Devices
Location
Microapps Theater, Booth 5423
Abstract

Modern vehicles are equipped with increasing communication functions and sensors, resulting in an increase of jamming signals in the vicinity of the GNSS reception band. These jamming signals cannot always be removed by simple filters. High linearity of a GNSS Wideband LNA can help improve jamming tolerance. But there is a tradeoff - high linearity can contribute to higher current consumption. Nisshinbo added a linearity compensation circuit to our Wideband LNA to keep the current consumption low at normal operation and to improve linearity during high EMI/RFI conditions.  This method can simplify the antenna-mounted filter in GNSS automotive antenna applications.

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Carlo Poledrelli
Mini-Circuits
Location
Microapps Theater, Booth 5423
Abstract

The design and measurement results of a 9W MMIC power amplifier, covering the 7.1-8.5GHz frequency range, is described. The PA was fabricated on a mature 0.25um GaAs optically-defined gate process with Enhanced Moisture Ruggedness layer. The PA is assembled in a low-cost 6x6mm QFN package and features integrated ESD protection. In CW mode, the amplifier exhibits 28dB of linear gain and 39.5dBm of saturated output power, with 34% associated efficiency. Optimal thermal design allows for operation up to 105°C. State-of-the-art performance, enhanced reliability, in conjunction with low-cost technologies, make this PA a very attractive option for C/X band communication systems.

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Andy Howard
Keysight
Location
Microapps Theater, Booth 5423
Abstract

Noise Power Ratio is a measure of a power amplifier’s distortion. It is commonly used to characterize power amplifiers for space systems although not limited to this. This presentation goes over key things to consider when simulating NPR as well as how to analyze results to make design decisions.

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Hiroshi Sato
Nisshinbo Micro Devices
Location
Microapps Theater, Booth 5423
Abstract

LNAs (Low Noise Amplifiers) are used to improve receive sensitivity and error rate, issues that are related to NF (Noise Figure). To improve NF, Nisshinbo has been working to shorten the FET gate length (Lg) for LNAs produced in our in-house GaAs Fab.  We also optimized the gate structure by lowering gate resistance (Rg) and gate-source capacitance (Cgs) to achieve a significant reduction of the LNA NF. In this presentation we will highlight the GaAs FET gate structural modifications needed to achieve the described NF reduction and reveal initial test results. 

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Tudor Williams
Filtronic Broadband Ltd.
Location
Microapps Theater, Booth 5423
Abstract

To meet demanding performance requirements, particularly in the defence sector, gallium nitride (GaN) has emerged as a superior alternative to GaAs due to its greater power density, efficiency, and higher operating temperatures. Filtronic will showcase how GaN’s wide bandgap properties make it the ideal choice for applications where size, weight, and power (SWAP) are critical, such as in defence, space, and aerospace. Discover how these advantages position GaN as the optimal solution for high-performance needs.

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Eduard Heidebrecht, David Bierbuesse
MillerMMIC
Location
Microapps Theater, Booth 5423
Abstract

In this presentation, we will demonstrate the technology capabilities of RF circuit design automation using the RapidRF software tool. We will show how state-of-the-art RFIC amplifier designs can be automatically generated with a simple push-button solution. Throughout the presentation we will demonstrate the entire design process, from entering the required circuit specifications, through performance validation, to creating final tapeout-ready design files.

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Matt Ozalas
Keysight Technologies
Location
Microapps Theater, Booth 5423
Abstract

3D Heterogeneous Integration is becoming a trend in the RF/MW industry to integrate mixed technologies (Silicon RFICs, III-V MMICs, packaging, passives, antennas and PCBs) into convenient drop in RF modules to enable the exponential growth of RF applications for high throughput wireless data transport demanded by commercial and defense-aerospace AI/Machine Learning requirements.
This microapps paper illustrates how RF EDA tools are now enabling 3DHI physical assembly, 3D RF routing and connectivity verification, followed by EM-circuit co-simulation/co-optimization of any RF path through the 3DHI structure. Electrothermal simulation is also enabled to accurately predict 3DHI RF performance in actual field deployment scenarios.

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Ajeet Pal, Harish Ramesh, Jason Xavier
Texas Instruments
Location
Microapps Theater, Booth 5423
Abstract

Large phased array systems include multiple RF sampling data converters, which require high precision synchronization to achieve proper beam steering. Synchronization can be achieved by properly aligning the device clocks and phase adjustability of SYSREFs to the data converters for meeting setup and hold time. SYSREFs in large array system can be generated or distributed on tile level, sub-system level and from the host in continuous, pulsed or burst mode. This presentation proposes the JESD204B/C clock buffer-based solution for precise SYSREFs phase alignment and distribution for synchronization up to X-band sampling clocks.

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Alexander Krauska
Tektronix
Location
Microapps Theater, Booth 5423
Abstract

Quantum systems require exceptional precision and fidelity in control and readout operations . As gate times in quantum systems reach the picosecond (pS) scale, the need for high-speed sequencing and accurate waveform generation becomes increasingly critical. This presentation explores the advantages of Arbitrary Waveform Generators (AWGs) in addressing the stringent requirements of quantum calibration, control, and operation.
We will highlight the capabilities of Tektronix’s AWG70000 and AWG5200 series, emphasizing their ability to generate high-fidelity waveforms at pS rates and their integration with advanced oscilloscopes for comprehensive system calibration and monitoring. Key topics will include optimizing workflows for quantum operation.

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Petre Minciunescu
Analog Devices Inc
Location
Microapps Theater, Booth 5423
Abstract

Synchronizing systems with a high number of ADCs/DACs is very difficult. New features implemented in an analog PLL and a synchronizer IC can help synchronize such systems. The PLL can introduce delays on both device clock and SYSREF to compensate propagation delays, while the synchronizer measures and compensates the round-trip delays that may happen on one or two wire connections. The seminar presents how such a system may be architected using a tree or a cascade approach and how the synchronization may be achieved.

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Kerry Judd
Cadence Design Systems, Inc.
Location
Microapps Theater, Booth 5423
Abstract

More than Moore is driving interest in integrating multiple die into a single package which brings system-level considerations for planning and placing components and die into a small space. Integrating different chip architectures and manufacturing processes necessitates sophisticated design tools and methodologies. Cadence Virtuoso Studio enabled for multi-process technologies brings the heterogeneous integration within a single platform.