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Tue 17 Jun | 13:15 - 13:30
MicroApps Theater, IMS Exhibit Hall
Fast S-parameter measurements for filter test
New advances in Vector Network implementations allow faster sweep times with increased sensitivity to enable faster and more accurate S parameter measurements. This is of special interest in the world of growing number of supported frequency bands and thus more filter paths in modern mobile phones. Adding more filter paths means more expensive validation. Reducing the test time is a major strike back to cut test cost without sacrificing sensitivity and measurement uncertainty.