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Thu 19 Jun | 10:10 - 11:50
206
Addressing Challenges and Techniques for RFIC Characterization in the 6G Era
Markus Rullmann, Gerardo Orozco, Paulo Lamas, Michael Barrick
Emerson Test and Measurement
The advancement towards 6G necessitates many innovations to transform vision into reality. Concurrently, the complexity and number of parameters requiring characterization are increasing, posing challenges in meeting commercial timelines. This workshop will address several ongoing trends that are enhancing our front-end devices. The presentations will provide valuable and comprehensive information on trends and measurement techniques for RFICs. The topics include linearization techniques, GaN power amplifiers, pulsed measurements and the workshop will conclude with an interactive session exploring the anticipated impact of artificial intelligence (AI) on the characterization of these devices.