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  Tue 17 Jun | 12:15 - 12:30
            MicroApps Theater, IMS Exhibit Hall
      Revolutionize Phased Array Testing: Radiation Patterns in Seconds, Not Minutes
      
             Characterizing phased arrays demands numerous radiation pattern measurements to ensure uniform, fast, and accurate beam steering with minimal scan loss and side-lobe levels. Additional tests for tapering, null steering, and dual-polarization control further increase the burden. Discover how to drastically reduce measurement time from minutes to seconds, enabling more comprehensive phased array testing. Our seminar demonstrates a game-changing approach to rapid radiation pattern measurement, transforming your testing workflow.
      
