Back to IMS Schedule
Wed 18 Jun | 13:30 - 15:10
206
New methods on wideband device characterization for amplifiers and phased arrays
Wolfgang Wendler, Johan Nilsson, Darren Tipton, Florian Ramian, Martin Lim, Markus Loerner
Rohde & Schwarz, Rohde & Schwarz North America
In this event, we will delve into innovative methods for characterizing both passive and active devices, showcasing novel methodologies and architectures for measurement applications in radar, satellite and mobile communication technologies. Our primary objective is to provide a comprehensive and precise understanding of the device under test, ensuring that the influence of the measurement system is kept to an absolute minimum. By focusing on wideband modulated signals, participants will gain valuable insights into new approaches in characterization methods, equipping them with the knowledge to improve their own testing processes and results across various applications.