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Thu 19 Jun | 11:00 - 11:15
MicroApps Theater, IMS Exhibit Hall
Using EVM to Assess the Quality of Power Management Circuits in RF Signal Chains
Eamon Nash
Analog Devices
When a digitally modulated signal passes through an RF signal chain, its Error Vector Magnitude (EVM) is affected by noise, spurs and distortion. Since power management circuits generate noise and spurs, EVM can be a useful metric for assessing their quality. This Microapps talk will compare EVM results for QAM signals being amplified by RF amplifiers when those amplifiers are being powered by various power management circuits. We will focus in particular on the performance difference between LDO and Switcher based power management circuits.