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Thu 11 Jun | 11:10 - 11:25
Room MicroApps Theater, IMS Exhibit Hall
RF system validation relies heavily on prototyping, chamber and over-the-air measurements. Yet physical testing cannot capture practical edge cases such as complex device orientation, dynamic blockage, and multipath environments.
Remcom is showcasing a scalable automation workflow that integrates XFdtd® and Wireless InSite® to bridge the gap between component-level RF and channel-level performance. We demonstrate an automated pipeline where antenna geometries are simulated in XFdtd, generating Huygens surfaces and S-parameters to analyze in-situ performance with Wireless InSite. This seamless integration allows engineers to model site-specific propagation across complex indoor, urban, and NTN scenarios using the near-fields of the device.