IMS Industry Showcase

IMS Industry Showcase
Monday, 17 June 2024
15:10-17:00
Ballroom Foyer, Walter E. Washington Convention Center

Join us before the IMS Plenary Session for the Industry Showcase where selected IMS paper authors will present their work.

Th2G- 3: Enhanced Accuracy in On-Wafer Noise Figure Measurements at Sub-Terahertz Frequencies 
Nizar Messaoudi, Keysight Technologies

Tu4C-3: Advancements in 300mm GaN-on-Si Technology with Industry’s First Circuit Demonstration of Monolithically Integrated GaN and Si Transistors 
Qiang Yu, Intel Corporation

Tu4E-5: A 6.8 - 9.4 GHz LNA Achieving 36.5 dB Peak Gain, Consuming 4.28 mW with an Adjustable Threshold Limiter for IR-UWB Applications 
Stefan Lepkowski, Sandia National Laboratories

Th1E-2: A Novel Q-Choked Resonator for Microwave Material Measurements Alleviating Sample Thickness Limitations of Existing Techniques 
Malgorzata Celuch, QWED Sp. z o.o.

Tu4A-5: Incorporating Resistive Foil RF Attenuators and Equalizers on and within PCBs from DC to 60 GHz: Design, Analysis, and Experimental Validation 
Maurio Grando, Invictus Animus Research and Design

IF1-15: Machine-Learning Assisted Digital Predistortion Using Feedback via Dual-Polarized Antenna Arrays 
Yuuichi Aoki, Samsung Electronics Co., Ltd.

IF1-30: Improve RF Dual Probe Calibration Accuracy with Peer-Terminated Standards 
Hung Che Fu, MPI Corporation

IF1-33: Additively Manufactured High-Power Light Weight Millimetre-Wave Band Pass Filter Optimized with AI Tuning Algorithm for 5G Space Applications 
Laila Salman, ANSYS, Inc.

IF1-10: A 0.9 to 4.0 GHz High Efficiency Reactively-Matched GaN Power Amplifier MMIC 
Jun Kamioka, Mitsubishi Electric Corporation

Th2C-1: 220-GHz High-Efficiency Power Amplifiers in 250-nm and 130-nm InP HBT Technologies having 14.4-25.0% PAE and 40-60 mW Pout 
Zach Griffith, Teledyne Scientific

Tu1F-2: An All-Digital Synthesizer Enabled by a Convolutional Neural Network 
Chris Thomas, Boeing

Th2G-4: Measurement of Residual Phase Noise of Amplifiers at 80 GHz Using Interferometric Measurement Technique 
Wolfgang Wendler, Rohde & Schwarz GmbH & Co KG