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Thu 11 Jun | 12:01 - 12:16
Room MicroApps Theater, IMS Exhibit Hall
Traditional RF measurements using a signal generator and analyzer measure the sum of all distortions in the test device as well as in the test setup. Using best in class instrumentation is the common approach to limit unwanted effects. This session discusses a new approach using residual measurement techniques tackling this challenge. This helps not only for amplifier measurements but also for frequency translating measurements to access the true test device performance.