User Forums

Program: 
•15:00 - 15:05 - Welcome
Patrick Roblin (The Ohio State University, USA) and Apolinar Reynoso Hernandez (CICESE, Ensenada, Mexico)

•15:05 - 15:25 - Round Table Self-Introduction of All Attendees + Bring a Slide

•15:25 - 15:50 - VNA-based characterization of frequency multipliers and frequency multiplier-based transmitters
Ahmed Ben Ayed and Slim Boumaiza, Department of Electrical and Computer Engineering , Antennas, Microwaves and Wave Optics Emerging Radio Systems Group

•15:50 - 16:00 - Discussion

•16:00 - 16:15 - Broadband EVM measurement for VSGs using a VNA-based technique
Gian Piero Gibiino (speaker), Alberto Maria Angelotti, University of Bologna, Italy

•16:15 - 16:25 - Discussion

•16:25 - 16:30 - Farewell
  
For those of you who are new to us, we are an informal discussion group devoted to sharing information and issues related to the measurements and instrumentation in the vector large-signal network analysis (NVNA/LSNA) of nonlinear microwave circuits and systems. The Forum is also a discussion venue for calibration issues, data representation methods (and models), and other techniques related to these nonlinear measurements.

We are always welcoming topics of discussions and research updates. If you are interested to preset your research work at NVNA User's Forum, contact Patrick Roblin.

Program: 
•16:30 - 16:35 - Welcome
Macro Spirito (Delf University of Technology, The Netherlands), Jon Martens (Anritsu, USA), Andrej Rumiantsev (MPI Corporation, Taiwan), Gia Ngoc Phung (PTB) 

•16:35 - 16:50 - Traceability for on-wafer S-parameter measurements
Uwe Arz, PTB

•16:50 - 17:05 - Discussion

•17:05 - 17:15 - On Probe-Tip Calibration Reference Impedance
Lucas Nyssens, UCL

•17:15 - 17:30 - Discussion

•17:30 - 17:40 - Automated & Nanorobotics Millimeter-Wave On-Wafer Probe Station
Kamel Haddadi, University of Lille

•17:40 - 17:55 - Discussion

•17:55 - 18:00 - Farewell

For those of you who are new to us, we are an informal discussion group devoted to sharing information and issues related to the on-wafer measurement and calibration practices. The Forum is also a platform to define workgroups and gather experts in the field to progress the field of on-wafer measurements and calibrations.

Forum principles: 
• Facilitate discussion with like-minded engineers
• Open exchange of experience, ideas, discussion of problems
• Informal atmosphere

If you want to suggest a topic or present a research update at an upcoming forum, contact any of the On-Wafer Users' Forum organizer: Andrej Ruminatsev