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Tue 9 Jun | 15:40 - 17:20
257AB
This session presents recent advancements in device and circuits for system integration. Notable component advances include: a low loss X-Band Switched-Capacitor Delay Element and signal repeater implemented in 45nm SOI CMOS technology; a dual-mode circular cavity filter; a high-performance RF-SOI switch fabricated on 130nm 200mm technology platform that incorporates a 65nm device; and a multi-channel transceiver featuring Built-in-Self test functionality enabled by integrated directional couplers. These papers represent significant progress in the field, driving enhanced system integration with optimized performance.
15:40 - 16:00
Tu4C-1 Accurate, High Coverage On-Chip Built-in Self-Test Adopting Precision-Enhanced Power Detection and Multipath Loopback for mmWave Radar IC Measurements
16:00 - 16:20
Tu4C-2 Dual-Mode Circular Cavity Filters via Azimuthal Wave Propagation
16:20 - 16:40
Tu4C-3 Sub-60 fs RFSOI Switch Performances in Advanced 200 mm 130/65 nm Hybrid Technology
16:40 - 17:00
Tu4C-4 A 9-11 GHz Multistage Switched-Capacitor Delay Element and Signal Repeater Achieving 4.6-71.4 ns Delay and 40 dB Gain