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WMF-2: Measurement Accuracy Improvement in On-Wafer Measurement by RF Signal Detection Technique
AIST has been developing high-precision on-wafer measurement technologies. RF probe position of the three axes (X-, Y-, and Z-axes) and its planarization are controlled with an accuracy that exceeds t...
WMF-3: Transferring On-Wafer Traceability to Industrial Lumped-Element Calibrations
Currently, on-wafer traceability is directly linked to Multiline TRL, which is widely recognized as one of the most accurate on-wafer calibrations. In industrial applications, however, fixed-distance ...
WMF-4: Optimizing Calibration Process and Reducing Measurement Uncertainties in Wafer-Level mm-Wave Range Characterization
Wafer-level measurements in the mm-wave frequency range are essential for the precise characterization of high-frequency semiconductor devices and circuits. However, the increasing complexity of mm-wa...
WMF-5: Broadband Differential On-Wafer Measurements: Challenges in De-Embedding, Drive Control and Related Aspects
At lower mm-wave frequencies, differential devices are commonly used for efficiency, noise, real estate and other reasons and their characterization is increasingly important over broadband frequencie...
WMF-6: On-Wafer 4-Port Measurements from 70kHz to 220GHz in a Single Sweep
After maturing the on-wafer single-sweep 70kHz-to-220GHz 2-port measurement for two years, we recently started doing similar measurements with 4 ports. The initial results and challenges will be prese...
WMF-7: On-Wafer Characterization of Sub-THz InP HBTs: Importance of Choosing the Proper Error Correction Algorithm
For down-scaled sub-THz transistors determination of Mason’s gain is associated with various challenges, which compromises the reliability of the extracted values for the maximum frequency of oscillat...
WMF-8: Approaches to Carry Out Well-Documented Measurements for Active Devices Using Varying Calibration Methodologies
One area of recent interest has been the study of sensitive figures of merit for active devices with a variety of calibration approaches. In our study, approaches were developed to perform calibration...
WMF-9: Addressing SiGe HBT Measurement Challenges Through the 16-Error-Term Calibration Method
This presentation will address the challenges involved in characterizing SiGe HBT transistors. To enhance transistor performance, process engineers continuously shrink transistor dimensions and minimi...
WMF-10: mm-Wave On-Wafer Measurements from a CMOS IC Designer’s Perspective
This talk will discuss on-wafer measurement issues that the speaker and his colleagues encountered and dealt with in developing mm-wave and sub-THz CMOS integrated circuits. The main focus will be mea...
WMA-1: Advanced Techniques for 5G PA and Front-End Modules Packaging and Thermal Management
This workshop will cover the present designs of 5G RF front-end modules used in RF cellular technologies, as well as the obstacles presented by the implementation of 5G and its future progression to 6...