We1C: Signal and System Characterization

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Wed 10 Jun | 08:00 - 09:40
254AB
Jon Martens
Anritsu Co.
Xiaobang Shang
National Physical Laboratory
Increased levels of integration make antennas, modulation sources, and circuit nodes inaccessible to direct measurement. This session explores measurement techniques that use the signals that are indirectly available, including contactless and modulation-based methods.
08:00 - 08:20
We1C-1 Assumption-Free Active Calibration of mm-Wave Phased Arrays using Excitation Estimation via Far-field Measurements
ABSTRACT
Mohammad Abdollah Chalaki, Ahmed Ben Ayed, Patrick Mitran, Slim Boumaiza
Univ. of Waterloo, Univ. of Waterloo, Department of ECE, University of Waterloo, Univ. of Waterloo
08:20 - 08:40
We1C-2 Over-the-Air Measurement of Distortion Error-Vector-Magnitude in a Reverberation Chamber
ABSTRACT
Thaimi Niubo Aleman, Teun van den Biggelaar, Roel Budé, Anouk Hubrechsen, Jan Verspecht
Keysight Technologies, ANTENNEX, ANTENNEX, ANTENNEX, Keysight Technologies
08:40 - 09:00
We1C-3 Cross-Correlation Based Absolute and Residual Phase Noise Measurements on Chirped Pulses
ABSTRACT
Wolfgang Wendler, Bernhard Gäde, Alexander Roth, Jonas Kornprobst
Rohde & Schwarz GmbH & Co KG, Rohde & Schwarz GmbH & Co KG, Rohde & Schwarz GmbH & Co KG, Rohde & Schwarz GmbH & Co KG
09:00 - 09:20
We1C-4 Deep-Learning-Based Pixelated Microwave Filter Design and Characterization using Electro-Optical Electric-Field Measurements
ABSTRACT
Han Zhou, Richard Bannister, Caspar Pierce, Haojie Chang, David Widén, Ludvig Fornstedt, Gabriel Melin, Alexander Bohlin, Pontus Fredriksson, Dilbagh Singh, Christian Fager, Koen Buisman
Chalmers Univ. of Technology, Univ. of Surrey, Univ. of Surrey, Chalmers Univ. of Technology, Chalmers Univ. of Technology, Chalmers Univ. of Technology, Chalmers Univ. of Technology, Chalmers Univ. of Technology, Chalmers Univ. of Technology, National Physical Laboratory, Chalmers Univ. of Technology, Univ. of Surrey