We3D: Calibration De-Embedding Techniques for mm-Wave Devices

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Wed 10 Jun | 13:30 - 15:10
Room 257AB
Patrick Roblin
The Ohio State University
Ricardo Figueiredo
Instituto de Telecomunicações
This session focuses on accuracy and practical limits in mm-wave and sub-mm-wave measurements. It brings together recent advances in calibration and de-embedding methodologies spanning planar structures, cable and fixture characterization, and cryogenic S-parameter measurements using room-temperature calibration strategies. The session will open with a keynote talk revisiting and extending VNA-based non-linear mixer measurements up to mm-wave frequencies.
13:30 - 13:50
We3D-1 KEYNOTE: VNA-Based Mixer Measurements Revisited
ABSTRACT
Jon Martens
Anritsu
13:50 - 14:10
We3D-2 Generalized Thru-Reflect-Line Calibration for 1–220-GHz Single-Sweep Ultra-Wideband On-Wafer Measurement
ABSTRACT
Antonio Morini, Marco Farina, Richard Al Hadi, Tianze Li, Xinghao Tong, Lei Li, James C.M. Hwang
Università Politecnica delle Marche, ÉTS Montréal, Cornell Univ.
14:10 - 14:30
We3D-3 A Novel Cable Fixture Design for Material Characteristic Extraction Based on 2X-Thru De-Embedding Methods
ABSTRACT
Mon-Li Chang, Wei-Hsiu Tsai, Chin-An Lin, Tzu-Fang Tseng
NTUST, BizLink International
14:30 - 14:50
We3D-4 Accurate Cryogenic S-Parameter Measurement Technique Using Room-Temperature SOLT Calibration and 2X-Thru De-Embedding
ABSTRACT
Yin-Cheng Chang, Yu-Shao Shiao, Wen-Lin Chen, Bo-Yuan Chen, Kun-Ming Chen, Guo-Wei Huang, Ta-Yeh Lin, Da-Chiang Chang, Shawn S.H. Hsu
NARLabs-TSRI, National Tsing Hua Univ.