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Wed 10 Jun | 13:30 - 15:10
257AB
This session focuses on accuracy and practical limits in millimeter- and submillimeter-wave measurements. It brings together recent advances in calibration and de-embedding methodologies spanning planar structures, cable and fixture characterization, and cryogenic S-parameter measurements using room-temperature calibration strategies. The session will open with a keynote talk revisiting and extending VNA-based nonlinear mixer measurements up to millimeter frequencies.
13:30 - 13:50
We3D-1 KEYNOTE: VNA-based Mixer Measurements Revisited
13:50 - 14:10
We3D-2 Generalized Thru-Reflect-Line Calibration for 1-220-GHz Single-Sweep Ultra-Wideband On-Wafer Measurement
14:10 - 14:30
We3D-3 A Novel Cable Fixture Design for Material Characteristic ExtractionBased on 2X-Thru De-embedding Methods
14:30 - 14:50
We3D-4 Accurate Cryogenic S-Parameter Measurement Technique Using Room-temperature SOLT Calibration and 2X-thru De-embedding