Back to IMS Schedule
Thu 11 Jun | 08:00 - 17:20
Room: 252AB
Quantum technologies such as quantum computing are rapidly evolving from theoretical promise to technological frontier, driven in large part by innovations in microwave engineering. At the heart of many quantum platforms — especially superconducting qubits — lie microwave signals and components that enable precise control and readout of quantum states. These systems operate in extreme cryogenic environments, often at temperatures below 50 millikelvin, where conventional microwave techniques face unprecedented constraints. As quantum processors scale to accommodate hundreds or thousands of qubits, the microwave infrastructure required to support them grows exponentially. This includes a dense network of coaxial cabling, attenuators, filters, amplifiers, and interconnects, all of which must perform reliably under cryogenic conditions. The resulting demands on thermal management, spatial efficiency, and signal fidelity are formidable, and they call for a new generation of microwave design and metrology tailored to quantum applications. This workshop will explore the role of microwave technologies in enabling quantum control and readout and examine the unique challenges of cryogenic measurements for semiconductor and superconductor components. Topics will include calibration and uncertainty analysis in quantum-limited regimes, design strategies for minimizing heat load while maximizing signal integrity, and the development of emerging standards for benchmarking quantum hardware. Attendees will hear from a diverse lineup of speakers including quantum system developers, microwave instrument manufacturers, academic researchers, and national metrology institutes, who are tackling the practical challenges of building scalable quantum computers.
WThA-1 Quantum Control and Characterization of NV Center Ensembles Using Keysight’s Quantum Control System
WThA-2 Accurate S-Parameter Measurements at Cryogenic Temperatures for Quantum Computing
WThA-3 Dominant Error Contributors in S-Parameter Measurements at Cryogenic Temperatures
WThA-4 Developing Cryogenic Standard Responses with Uncertainties at 4.2K using a Thermo-Mechanical EM Approach
WThA-5 How to Succeed in RF and mm-Wave On-Wafer Testing at Cryogenic Temperatures?
WThA-6 Challenges of On-Wafer Cryogenic Noise Parameter Measurements
WThA-7 Accurate On-Wafer Cryogenic Noise Measurement of LNAs Using an On-Chip SiGe BiCMOS Noise Source
WThA-8 Noise Performance Characterization of Parametric Amplifiers
WThA-9 Modified Variable Temperature Stage as a Microwave Power Meter for Cryogenic Environments
WThA-10 Design and Characterization of Broadband Superconducting Microwave Amplifiers with Near-Quantum-Limited Noise Performance