Marvin Test Solutions

Marvin Test Solutions will feature 5G Semiconductor Test Solutions with unrivaled production test speeds from DC to mmWave. Supporting up to 20 parallel VNA channels, capable of providing gap-free performance to 53 GHz, these systems deliver the most accurate, repeatable production S-parameter test performance available. Designed for mmWave packaged or wafer test, they combine speed and performance in a solution ideal for both low-volume production and high-volume OSAT manufacturing.
Struggling with semiconductor ATE obsolescence? Visit us in booth 847 to learn about the Marvin Test Expansion Kit (MTEK). Easily expandable in the field, it adds digital, analog and RF test capabilities to legacy semiconductor test systems lacking the ability to meet current and emerging test requirements.