Your search produced 886 results
Tu2F: AI / ML For Transmitter Systems
This session looks at AI/ML for transmitter blocks and elements including power amplifiers and pre-distorters.
TUMA4: Converting dBFS to dBm for Accurate Signal Measurements
This MicroApp session focuses on calibrating USRP Software Defined Radio (SDR) devices to accurately provide data in dBm. Attendees will explore critical calibration steps for precise signal measureme...
TUMA5: Frequency Finesse: The Art of Synchronized RF Spectrum Analysis
This microapps session spotlights the ease of configuration and use of two or more geographically distributed real-time spectrum analyzers operating in a synchronized way to enable time-aligned, multi...
TUMA6: Full XYZ Compensated Motion for Optimal On Wafer Pad Placement Accuracy
As frequencies get higher, and on wafer pad real estate shrinks, the final probe to pad placement becomes more and more critical.
At FormFactor we also s...
At FormFactor we also s...
PL3: AI in RFIC Design: Opportunities, Threats, and Limitations
The growth in generative AI has, naturally, raised the question of its impact on RFIC design. The latter has been traditionally regarded as somewhat of a black art, requiring the ‘magic&...
PL4: Climate Change – A Global Grand Challenge
This panel session offers a chance to engage conversation and exchange ideas about the significance and challenges in monitoring climate change and the potentials of utilizing microwave technologies f...
TUMA8: Measurement of Residual Phase Noise of Amplifiers at 80 GHz Using Interferometric Measurement Technique
Beside wideband noise amplifiers or frequency converting devices add phase noise, the so called additive or residual phase noise, to the signal path. This is even worse for power amplifiers. Designer ...
TUMA9: Noise Figure Measurement in the 90 GHz Range Using a Noise Source and Harmonic Mixers in Combination with a Spectrum Analyzer
The noise figure of a device provides a quantifiable measure of the noise that a DUT adds to a signal as it passes through the DUT. The measurement described here uses the Y factor technique to measur...
TUMA10: RF & Microwave Test of Printed-Circuit Board Assemblies using Spring-Contacts and Probes
In this seminar, several techniques are presented how to run production tests on printed-circuit board assemblies with spring-loaded test probes and contacts. “Conventional” spring...