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The new 6G communication standard is in favor of full-duplex (FD) or sub-band FD (SBFD) to meet latency and coverage requirements or allow even new sensing functionalities. Practical challenges for mo...
Tactical Converged RF Systems require efficient and dynamic use of the electromagnetic spectrum for reduced SWaP of RF systems, where self and external interference will limit the performance. Moreove...
Material properties are essential model inputs and design constraints when designing new or improved devices. NIST uses a suite of tools for measuring the broadband electrical properties of a wide ran...
AIST has been developing high-precision on-wafer measurement technologies. RF probe position of the three axes (X-, Y-, and Z-axes) and its planarization are controlled with an accuracy that exceeds t...
Currently, on-wafer traceability is directly linked to Multiline TRL, which is widely recognized as one of the most accurate on-wafer calibrations. In industrial applications, however, fixed-distance ...
Wafer-level measurements in the mm-wave frequency range are essential for the precise characterization of high-frequency semiconductor devices and circuits. However, the increasing complexity of mm-wa...
At lower mm-wave frequencies, differential devices are commonly used for efficiency, noise, real estate and other reasons and their characterization is increasingly important over broadband frequencie...
After maturing the on-wafer single-sweep 70kHz-to-220GHz 2-port measurement for two years, we recently started doing similar measurements with 4 ports. The initial results and challenges will be prese...
For down-scaled sub-THz transistors determination of Mason’s gain is associated with various challenges, which compromises the reliability of the extracted values for the maximum frequency of oscillat...
One area of recent interest has been the study of sensitive figures of merit for active devices with a variety of calibration approaches. In our study, approaches were developed to perform calibration...